Predicting Cold Tolerance of Potato Plants by Electric Conductivity Measurements on Leavesunder Low-temperature Stress

LI Hua-wei; LIN Zhi-jian; XU Yong-qing; LUO Wen-bin; JI Rong-chang; ZHANG Hong; LI Guo-liang; LIU Zhong-hua; QIU Yong-xiang; QIU Si-xin; TANG Hao

doi:10.19303/j.issn.1008-0384.2016.08.004

Volume 31 Issue 8

Oct. 2016

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Article Navigation > Fujian Journal of Agricultural Sciences > 2016 > 31(8): 810-815

LI Hua-wei, LIN Zhi-jian, XU Yong-qing, LUO Wen-bin, JI Rong-chang, ZHANG Hong, LI Guo-liang, LIU Zhong-hua, QIU Yong-xiang, QIU Si-xin, TANG Hao. Predicting Cold Tolerance of Potato Plants by Electric Conductivity Measurements on Leavesunder Low-temperature Stress[J]. Fujian Journal of Agricultural Sciences, 2016, 31(8): 810-815. doi: 10.19303/j.issn.1008-0384.2016.08.004

Citation:

LI Hua-wei, LIN Zhi-jian, XU Yong-qing, LUO Wen-bin, JI Rong-chang, ZHANG Hong, LI Guo-liang, LIU Zhong-hua, QIU Yong-xiang, QIU Si-xin, TANG Hao. Predicting Cold Tolerance of Potato Plants by Electric Conductivity Measurements on Leavesunder Low-temperature Stress[J]. Fujian Journal of Agricultural Sciences, 2016, 31(8): 810-815. doi: 10.19303/j.issn.1008-0384.2016.08.004

Citation:

LI Hua-wei, LIN Zhi-jian, XU Yong-qing, LUO Wen-bin, JI Rong-chang, ZHANG Hong, LI Guo-liang, LIU Zhong-hua, QIU Yong-xiang, QIU Si-xin, TANG Hao. Predicting Cold Tolerance of Potato Plants by Electric Conductivity Measurements on Leavesunder Low-temperature Stress[J]. Fujian Journal of Agricultural Sciences, 2016, 31(8): 810-815. doi: 10.19303/j.issn.1008-0384.2016.08.004

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Predicting Cold Tolerance of Potato Plants by Electric Conductivity Measurements on Leavesunder Low-temperature Stress

doi: 10.19303/j.issn.1008-0384.2016.08.004

LI Hua-wei^{1, 2
,},
LIN Zhi-jian^{1, 2},
XU Yong-qing^{1, 2},
LUO Wen-bin^{1, 2},
JI Rong-chang^{1, 2},
ZHANG Hong^{1, 2},
LI Guo-liang^{1, 2},
LIU Zhong-hua^{1, 2},
QIU Yong-xiang^{1, 2},
QIU Si-xin^{1, 2},
TANG Hao^{1, 2
,
,}

1.
Crop Institute Research Centre, Fujian Academy of Agricultural Sciences, Fuzhou, Fujian 350013, China
2.
Scientific Observing and Rxperimental Station of Tuber and Root Crops in South China, Fuzhou, Fujian 350013, China

Received Date: 2016-01-05
Rev Recd Date: 2016-05-04
Publish Date: 2016-08-01

Abstract

Abstract

Eighteen potato cultivars and forty-seven strains were tested for their abilites to tolerate frost and freezing temperatures. Leaves freshly detached from the potato plants were exposed to low temperatures for electric conductivity measurement to derive the medium lethal temperatures, LT₅₀, on each sample. As temperature was lowered, the relative electric conductivity of the potato leaves responded in a typical S function in a logistic equation. The LT₅₀ obtained from the regression equation varied from -3.8℃ to -1℃. They significantly differed among different cultivars and stains. Based on LT₅₀, cold resistances of the various potato cultivars and strains were predicted and clustered into 3 categories, sensitive, medium, and tolerant to freezing. Among them, the two cultivars and 4 strains most tolerant to freezing were preserved for breeding low-temperature resistant varieties in the future.
- potato,
- relative electric conductivity,
- LT₅₀,
- cold tolerance

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References(21)

References

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